Registration is possible to be on the waiting list.
SUMMER SCHOOL in INSECT PATHOLOGY
Prevention and Control of Diseases and Contaminants in Insectaries
Friday 29th of July 2016
Location : Institut de Recherche sur la Biologie de l’Insecte, Université François Rabelais, Faculté des Sciences, Parc Grandmont Tours, France
Mass rearing of insects under artificial conditions often leads to overcrowding and stressful environments, making insects susceptible to pathogens and even causing disease directly. It is thus very important that insectary workers become familiar with potential insect diseases and recognise them when they occur. The impact of these diseases is not limited to the insect colony; accuracy of bioassay results and success of biological control programs may be compromised with the use of insects with chronic diseases.
Lecture topics :
- Impact of diseases and contaminants on production and uses of laboratory-reared insects
- Insect pathology basics
- Biology of different insect pathogen groups, including common and well-studied species
- General control practices
- Insect colony establishment and maintenance
- Plus a brief review of related topics (i.e., use of artificial diets, insectary design, and insect genetics)
Laboratory Practical :
Hands on exercise on disease diagnosis and identification of different pathogen groups: uninfected versus infected insects, signs and symptoms of common insect diseases, handling of infected insects and microscopy.
- Louela Castrillo (Department of Entomology, Cornell University, USA)
- Annette Jensen (Department of Plant and Environmental Science, University of Copenhagen, Denmark)
- Christina Nielsen-LeRoux (INRA, AgroParisTech, UMR Micalis, France)
- Madoka Nakei (Tokyo University of Agriculture and Technology, Japan)
- Elisabeth Herniou (IRBI UMR CNRS 7261, Université François Rabelais, France)
Attendance is limited to 24 people
Register through the main SIP registration site.
Registration fees include :
Attendance to lectures and practical, coffee breaks and lunch.